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Publisher
ACM Transactions on Software Engineering and Methodology(1)
ESEM 2010 - Proceedings of the 2010 ACM-IEEE International Symposium on Empirical Software Engineering and Measurement(1)
Área temáticas
Ciencias de la computación(2)
Física aplicada(1)
Programación informática, programas, datos, seguridad(1)
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scopus(2)
Evaluating the usefulness of a functional size measurement procedure to detect defects in MDD models
Conference ObjectAbstract: Models are key artifacts in Model-Driven Development (MDD) methods. To evaluate the quality of modelPalabras claves:Case study, defect detection, Functional Size, MDDAutores:Alain Abran, Giachetti G., Maŕin B., Pastor Ó., Vos T.E.J.Fuentes:scopusUsing a functional size measurement procedure to evaluate the quality of models in MDD environments
ArticleAbstract: Models are key artifacts in Model-Driven Development (MDD) methods. To produce high-quality softwarePalabras claves:Case study, defect detection, Functional Size, Model-driven developmentAutores:Alain Abran, Giachetti G., Maŕin B., Pastor Ó., Vos T.E.J.Fuentes:scopus