Palabras claves: carrier-selective passivating contacts, hydrogen annealing, hydrogenated fluorine-doped indium oxide (IFO:H), transparent conductive oxide (TCO), ultrathin SiO /poly-Si passivating contacts x
Autores: Eijt S., Han C., Isabella O., Mazzarella L., Montes A., Paul Procel, Schut H., Yang G., Zeman M., Zhang X., Zhao Y.