Mostrando 3 resultados de: 3
Filtros aplicados
Publisher
IECON Proceedings (Industrial Electronics Conference)(1)
IEEE International Symposium on Industrial Electronics(1)
Measurement: Journal of the International Measurement Confederation(1)
Área temáticas
Física aplicada(2)
Ciencias de la computación(1)
Física(1)
Sacramentos, otros ritos y actos(1)
Área de conocimiento
Análisis numérico(1)
Ingeniería electrónica(1)
Optimización matemática(1)
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Origen
scopus(3)
Issues of exact laser ray positioning using DC motors for vision-based target detection
Conference ObjectAbstract: A new Technical Vision System for target detection using a Laser Scanner and the Dynamic TriangulatiPalabras claves:Autores:Fuentes W.F., Hernandez-Balbuena D., Juan Iván Nieto-Hipólito, Karthashov V., Lindner L., Murrieta-Rico F.N., Rivas-Lopez M., Rodriguez-Quinonez J.C., Sergyienko O., Tyrsa V.V.Fuentes:scopusResearch of the Uncertainty of Measurement Frequencies and Definitions of the Frequency Signal in the Waveguide with Respect to Power
Conference ObjectAbstract: In this work, a method is proposed for measuring the frequency and frequency deviations of a signalPalabras claves:power dissipation, Sensor, signal frequency, signal frequency deviation, waveguideAutores:Hernandez-Balbuena D., Juan Iván Nieto-Hipólito, Karthashov V., Kolendovska M., Semenets V., Serhiienko M., Tyrsa V.V., Wilmar Hernandez, Zakharov I.Fuentes:scopusPulse width influence in fast frequency measurements using rational approximations
ArticleAbstract: Many applications have been proposed for the frequency measurement principle using rational approximPalabras claves:Frequency Measurement, Measurement, Pulse width, Rational approximationsAutores:Hernandez-Balbuena D., Juan Iván Nieto-Hipólito, Karthashov V., Lindner L., Murrieta-Rico F.N., Petranovskii V., Rivas-Lopez M., Sergyienko O., Tyrsa V.V.Fuentes:scopus