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Erratum to: Sub-gap defect density characterization of molybdenum oxide: An annealing study for solar cell applications (Nano Research, (2020), 13, 12, (3416-3424), 10.1007/s12274-020-3029-9)
OtherAbstract: Ref. [56] was unfortunately wrong, Instead of [56] Corless, R. M.; Gonnet, G. H.; Hare, D. E. G.; JePalabras claves:Autores:Crupi I., Gulino A., Isabella O., Paul Procel, Scire D., Zeman M.Fuentes:scopusHigh-Mobility Hydrogenated Fluorine-Doped Indium Oxide Film for Passivating Contacts c-Si Solar Cells
ArticleAbstract: Broadband transparent conductive oxide layers with high electron mobility (μe) are essential to furtPalabras claves:electron mobility, hydrogenated fluorine-doped indium oxide (IFO:H), passivating contacts, Silicon heterojunction (SHJ), transparent conductive oxide (TCO)Autores:Gulino A., Han C., Isabella O., Mazzarella L., Montes A., Paul Procel, Spitaleri L., Tijssen M., Yang G., Zeman M., Zhang X., Zhao Y.Fuentes:scopusSub-gap defect density characterization of molybdenum oxide: An annealing study for solar cell applications
ArticleAbstract: The application of molybdenum oxide in the photovoltaic field is gaining traction as this material cPalabras claves:density of states, molybdenum oxide, polaron theory, Silicon heterojunction solar cellAutores:Crupi I., Gulino A., Isabella O., Paul Procel, Scire D., Zeman M.Fuentes:scopus