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Microscopy and Microanalysis(2)
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Ciencia de materiales(2)
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Characterization of defects and surface structures in microporous materials by HRTEM, HRSEM, and AFM
Conference ObjectAbstract: High-resolution transmission (HRTEM) and high-resolution scanning electron microscopy as well as atoPalabras claves:atomic force microscopy, Defect structure, Field emission scanning electron microscopy, MEL, MFI, MFI/MEL intergrowth, Surface structure, Transmission electron microscopy, X-Ray diffraction, ZeolitesAutores:Keller U., López Z.E., Luis José Borrero González, Reichelt R., Ricker A., Stracke W.Fuentes:googlescopusHigh-resolution scanning electron and scanning force microscopy of the zeolites EMT, FAU, and the intergrowth system EMT/FAU
Conference ObjectAbstract:Palabras claves:Autores:González S., Keller U., Luis José Borrero González, Reichelt R., Ricker A., Stracke W.Fuentes:googlescopus