Documentos de Rey S. | REDI

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Mostrando 4 resultados de: 4

Filtros aplicados

Palabras Claves: "SEU"

Subtipo de publicación

Conference Object(2)

Publisher

IEEE Transactions on Nuclear Science(2)

IEEE Radiation Effects Data Workshop(1)

Proceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS(1)

Área temáticas

Física aplicada(4)

Ciencias de la computación(1)

Ciencias sociales(1)

Área de conocimiento

Física de partículas(2)

Ingeniería electrónica(2)

Arquitectura de computadoras(1)

Ciencias de la computación(1)

Simulación por computadora(1)

Año de Publicación

Origen

Palabras Claves

Accelerated testing(2)

Accelerator-based neutron irradiation of integrated circuits at GENEPI2 (France)

Conference Object

Abstract: GENEPI2 is an accelerator facility located in Grenoble (France) which can provide neutrons of 3 MeV

Palabras claves:

Integrated circuits, Neutrons, Radiation facility, Radiation ground tests, SEU

Baylac M., Francesca Villa, Hubert G., Mansour W., Pablo F. Ramos, PABLO FRANCISCO RAMOS VARGAS, Rey S., Rossetto O., Velazco R.

Evaluating the SEE Sensitivity of a 45 nm SOI Multi-Core Processor Due to 14 MeV Neutrons

Abstract: The aim of this work is to evaluate the SEE sensitivity of a multi-core processor having implemented

Palabras claves:

Accelerated testing, AMP, Multi-core, SEE, SEFI, SEU, SMP, Soft error, SOI

Baylac M., Clemente J.A., Francesca Villa, Mehaut J.F., Pablo F. Ramos, Rey S., Vanessa Vargas, Velazco R., Zergainoh N.E.

Sensitivity to neutron radiation of a 45 nm SOI multi-core processor

Conference Object

Abstract: The purpose of this paper is to evaluate the SEU sensitivity of a multi-core SoC working in two diff

Palabras claves:

Asymmetric multi-processing, Multi-core, SEU, Soft error, SOI, Symmetric Multi-Processing

Baylac M., Clemente J.A., Francesca Villa, Pablo F. Ramos, Rey S., Vanessa Vargas, Velazco R., Zergainoh N.E.

Radiation Experiments on a 28 nm Single-Chip Many-Core Processor and SEU Error-Rate Pbkp_rediction

Abstract: This work evaluates the SEE static and dynamic sensitivity of a single-chip many-core processor havi

Palabras claves:

Accelerated testing, fault injection, Many-core, parallel processing, SEE, SEFI, SEU, Soft error

Baylac M., Dupont De Dinechin B., Francesca Villa, Jalier C., Mehaut J.F., Pablo F. Ramos, Ray V., Rey S., Stevens R., Vanessa Vargas, Velazco R., Zergainoh N.E.