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Advanced aging failure model for overhead conductors
Conference ObjectAbstract: Aging failure modeling is a fundamental requirement in reliability assessment of any actual power syPalabras claves:Aging failure modeling, Arrhenius relationship, Overhead conductors, Thermal stress, Weibull distributionAutores:Jayaweera D., Jeśus A. Játiva-Ibarra, Vasquez W.A.Fuentes:scopusReliability Study of a Smart Distribution System with Optimal Sizing and Placement of Capacitors
Conference ObjectAbstract: This work introduces a new modified IEEE 33-node test system to be smart by implementing distributedPalabras claves:capacitor, particle swarm optimisation, Power Losses, reliability assessment, sequential Monte Carlo simulation, smart distribution system, smart gridsAutores:Jayaweera D., Manuel S. Alvarez-Alvarado, Salinas-Herrera F., Xavier RiofrioFuentes:googlescopus