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Publisher: "2017 IEEE 2nd Ecuador Technical Chapters Meeting, ETCM 2017"

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Failure rate(1)

Markov chain(1)

Monte carlo simulation(1)

Static VAR Compensator(1)

reliability model(1)

Reliability model for a Static Var Compensator

Conference Object

Abstract: This paper presents a reliability model of a Static Var Compensator (SVC) using an innovative algori

Palabras claves:

Failure rate, Markov chain, Monte carlo simulation, reliability model, repair time, Static VAR Compensator

Jayaweera D., Manuel S. Alvarez-Alvarado