Evidence of the robustness of a cots soft-error free SRAM to Neutron Radiation

Article

Abstract: Radiation tests with 15-MeV neutrons were performed in a COTS SRAM including a new memory cell desig

Palabras claves:

Cots, LPSRAM, MUSCA SEP3, neutron tests, radiation hardness, reliability, Soft error, SRAM

Autores:

Baylac M., Clemente J.A., Francesca Villa, Franco F.J., Hubert G., Mansour W., Palomar C., Rey S., Rosetto O., Velazco R.

Fuentes:

scopus