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Dimensional metrology of nanometric spherical particles using AFM: I, model development
ArticleAbstract: A model to obtain the tip dimension and the true size of a spherical particle from an image producedPalabras claves:atomic force microscopy, Broadening effect, Tapping mode, Tip CalibrationAutores:Briceño-Valero J., Martínez L., Schilling C.H., V. J. GarcíaFuentes:scopusSolid solutions in the dilute magnetic semiconductor Mn<inf>x</inf>Zn<inf>1-x</inf>S
ArticleAbstract: The diluted magnetic semiconductor system MnxZn1-xS was studied using scanning electron microscopy,Palabras claves:Autores:Briceño-Valero J., Giriat W., Lopez-Rivera S., Martínez L., Mora A.E., V. J. GarcíaFuentes:scopus