Determination of cesium on nickel hexacyanoferrate-aluminum oxide modified electrodes


Abstract:

This report investigates the electrochemical behavior of hexacyanoferrate casted on Ni-Al2O3 modified electrodes and the preconcentration and detection of cesium ions on such films. It also studies the morphology and the composition of these surfaces. The film was grown on a glassy carbon (GC) surface. Five consecutive voltammetric cycles applied within 0.0 V and 1.6 V at a scan rate of 10 mV/s were enough to cast the film. Scanning electron microscopy (SEM) analyses showed a homogeneous, porous but broken surface of the film. Its composition was studied by X-ray diffraction (XRD). The presence of NiHCFe was confirmed by Fourier transformed infrared spectroscopy (FT-IR). The Cs{thorn} preconcentration from diluted solutions was accomplished in 90 s, under a negative potential of 0.20 V applied to the modified working electrode. The detection of cesium has a good sensitivity and a wide linear interval (108 and 10 12 mol L 1). Even so, the limit of detection calculated was extremely low (2 1016 mol L 1), cesium concentrations lower than 10 12 mol L 1 gave signals with no analytical significance. However, to our knowledge, this is the lowest level of cesium ever detected by an electroanalytical technique. © 2009 Wiley-VCH Verlag GmbH&Co. KGaA, Weinheim.

Año de publicación:

2009

Keywords:

  • FILM
  • Cesium
  • Electrodeposits
  • thin films
  • Electroactivity
  • Hexacyanoferrate
  • Ni-Al O 2 3
  • Preconcentration

Fuente:

scopusscopus
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Tipo de documento:

Article

Estado:

Acceso restringido

Áreas de conocimiento:

  • Química analítica
  • Electroquímica
  • Ciencia de materiales

Áreas temáticas:

  • Química analítica