Determination of cesium on nickel hexacyanoferrate-aluminum oxide modified electrodes
Abstract:
This report investigates the electrochemical behavior of hexacyanoferrate casted on Ni-Al2O3 modified electrodes and the preconcentration and detection of cesium ions on such films. It also studies the morphology and the composition of these surfaces. The film was grown on a glassy carbon (GC) surface. Five consecutive voltammetric cycles applied within 0.0 V and 1.6 V at a scan rate of 10 mV/s were enough to cast the film. Scanning electron microscopy (SEM) analyses showed a homogeneous, porous but broken surface of the film. Its composition was studied by X-ray diffraction (XRD). The presence of NiHCFe was confirmed by Fourier transformed infrared spectroscopy (FT-IR). The Cs{thorn} preconcentration from diluted solutions was accomplished in 90 s, under a negative potential of 0.20 V applied to the modified working electrode. The detection of cesium has a good sensitivity and a wide linear interval (108 and 10 12 mol L 1). Even so, the limit of detection calculated was extremely low (2 1016 mol L 1), cesium concentrations lower than 10 12 mol L 1 gave signals with no analytical significance. However, to our knowledge, this is the lowest level of cesium ever detected by an electroanalytical technique. © 2009 Wiley-VCH Verlag GmbH&Co. KGaA, Weinheim.
Año de publicación:
2009
Keywords:
- FILM
- Cesium
- Electrodeposits
- thin films
- Electroactivity
- Hexacyanoferrate
- Ni-Al O 2 3
- Preconcentration
Fuente:
Tipo de documento:
Article
Estado:
Acceso restringido
Áreas de conocimiento:
- Química analítica
- Electroquímica
- Ciencia de materiales
Áreas temáticas:
- Química analítica