Direct observation of surface polariton localization caused by surface roughness

Abstract:

Using a photon scanning tunneling microscope (operating at the wavelength of 633 nm) with shear force feedback we probe directly an optical field of surface plasmon polariton (SPP) while imaging simultaneously surface topography. We observe that near-field optical images, which are generated due to the SPP excited at a rough gold film surface, exhibit spatially localized (within 150–250 nm) intensity enhancement by up to 7 times. We find that the positions of these bright light spots do not correlate with the local surface topography and depend on the angle of exciting beam incidence. We relate the observed phenomenon to the strong localization of SPPs caused by surface roughness

Año de publicación:

1995

Keywords:

Fuente:

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