Analytic treatment of the incomplete ferromagnetic domain-wall model for exchange bias

Abstract:

The incomplete ferromagnetic domain-wall model we proposed recently is solved analytically. We derive the dependence of the exchange bias field (H<inf>EB</inf>) on the different parameters that characterize the magnetic bilayer system. Excellent agreement with the numerical solutions is achieved. Moreover, the model yields a crossover from a t<inf>F</inf>^-1 dependence of H<inf>EB</inf> for thin ferromagnetic films, to a t<inf>F</inf>^-1.9 dependence for thick films, where t<inf>F</inf> is the ferromagnetic film thickness. Our results are in agreement with experiment. © 2002 Elsevier Science B.V. All rights reserved.

Año de publicación:

2002

Keywords:

• exchange bias
• Magnetic devices
• Magnetic multilayers
• Interfaces
• Nanostructures

Fuente:

scopus