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Fano resonance in heavily doped porous silicon

Abstract:

Unexpectedly, the Fano resonance caused by the interference of continuum electron excitations with the longitudinal optical (LO) phonons was observed in random porous Si by Raman scattering. The analysis of the experimental data shows that the electron states trapped at the Si-SiO2 interface dominate in the observed Raman scattering. The gap energy associated with the interface states was determined. Copyright © 2011 John Wiley & Sons, Ltd.

Año de publicación:

2011

Keywords:

  • Raman spectroscopy
  • porous silicon

Fuente:

googlegoogle
scopusscopus

Tipo de documento:

Article

Estado:

Acceso restringido

Áreas de conocimiento:

    Áreas temáticas:

    • Luz y radiaciones afines

    Contribuidores:

    Koropecki R.R.Koropecki R.R.
    Luis José Borrero GonzálezLuis José Borrero González
    Comedi D.Comedi D.
    Urteaga R.Urteaga R.
    Acquaroli L.N.Acquaroli L.N.
    Tirado M.Tirado M.
    Arce R.D.Arce R.D.
    Rodrigues A.D.Rodrigues A.D.
    Pusep Y.A.Pusep Y.A.