Grenoble large scale facilities for advanced characterisation of microelectronics devices

Abstract:

The French IRT-Nanoelec consortium in collaboration with GENEPI2 accelerator is offering world unique and complementary techniques for Hirel components characterisation. Part of this capability is the high and low (thermal) energy neutron testing of devices.

Año de publicación:

2015

Keywords:

• Thermal neutrons
• Failure analysis
• Tomography
• Devices characterisation
• reliability
• Neutron irradiation

Fuente:

scopus