In-Situ FTIR Kinetic Study in the Silylation of Low-k Films with Hexamethyldisilazane Dissolved in Supercritical CO<inf>2</inf>
Abstract:
In-situ Fourier transform infrared spectroscopy measurements were obtained by using an innovative equipment to study the heterogeneous reaction between a hydrolyzed porous methylsilsesquioxane film and hexamethyldisilazane (HMDS) dissolved in CO2 at supercritical conditions. Gas and solid infrared signatures were separated to obtain kinetic information of the heterogeneous reaction. A two-step reaction mechanism was observed: a fast first step controlled by kinetics and a second step controlled by the diffusion of the HMDS inside the porous material. Infrared information was used to derive a rate law expression of the silylation reaction between HMDS and Si-OH. A first order of reaction relative to the concentration of hydrophilic sites was observed with activation energy of 51.85 ± 1.25 kJ/mol.
Año de publicación:
2016
Keywords:
- Silylation
- Semiconductors
- Reaction engineering
- Supercritical fluids
- HMDS
- kinetics
Fuente:
Tipo de documento:
Article
Estado:
Acceso restringido
Áreas de conocimiento:
- Síntesis química
- Polímero
- Ciencia de materiales
Áreas temáticas:
- Química analítica
- Ingeniería química
- Física aplicada