Optical methods of control and characterization of materials for infra-red detectors

Abstract:

A brief review is made of some classic and novel experimental techniques allowing the determination of the main parameters of semiconducting materials with the application of purely optical excitation. Among them some modifications of the photothermoacoustical method (in particular, with the pulse excitation), plasma reflection, sample scanning with the intense light beam.

Año de publicación:

1997

Keywords:

• Plasma reflection spectra
• SEMICONDUCTOR
• Photoacoustic spectroscopy
• Light beam scanning
• Photothermal pulse technique

Fuente:

scopus