Radiation experiments on a 28 nm single-chip many-core processor and SEU error-rate pbkp_rediction

Abstract:

This work evaluates the SEE static and dynamic sensitivity of a single-chip many-core processor having implemented 16 compute clusters, each one with 16 processing cores. The SEU error-rate of an application implemented in the device is pbkp_redicted by combining experimental results with those issued from fault injection campaigns applying the CEU (Code Emulating Upsets) approach. In addition, a comparison of the dynamic tests when processing-cores cache memories are enabled and disabled is presented. The experiments were validated through radiation ground testing performed with 14 MeV neutrons on the MPPA-256 many-core processor manufactured in TSMC CMOS 28HP technology. An analysis of the erroneous results in processor GPRs was carried-out in order to explain their possible causes.

Año de publicación:

2016

Keywords:

Fuente:

google