A dual Mach-Zehnder interferometer wavelength measurement device using silicon over insulator technology

Abstract:

A demonstration of a wavelength monitor using two unbalanced silicon based Mach-Zehnder interferometers is discussed. Its working principle is explained and a simulation of its operation is presented where a small modification of a MZI arm waveguide width yield an 'X-type' spectral response suitable for ratiometric power measurement. Finally, experimental results show a functional range of 2.2 nm with a spectral slope of 5.6 dB/nm.

Año de publicación:

2016

Keywords:

• wavelength filtering device
• wavelength measurement
• Integrated Optics

Fuente:

scopus

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