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Applying the V-I Matrix Method in the Analysis of Silicon Integrated Bragg Gratings

Abstract:

Optical devices are commonly simulated using transfer matrix techniques for spectrum analysis. Here, the V-I (ABCD) matrix method is reported for integrated Bragg grating (IBG) analysis. This technique was implemented in a numerical simulation and compared with a Silicon-on-Insulator fabricated IBG device with a sidelobe suppression of 4 dB and FWHM of 4.5 nm giving insights on design-fabrication issues.

Año de publicación:

2018

Keywords:

    Fuente:

    scopusscopus
    googlegoogle

    Tipo de documento:

    Conference Object

    Estado:

    Acceso restringido

    Áreas de conocimiento:

    • Fotovoltaica
    • Ingeniería electrónica
    • Ciencia de materiales

    Áreas temáticas:

    • Física aplicada

    Contribuidores:

    Germán Vargas LópezGermán Vargas López