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AEIT Annual Conference 2013: Innovation and Scientific and Technical Culture for Development, AEIT 2013 - Selected Proceedings Papers(2)
2016 IEEE Ecuador Technical Chapters Meeting, ETCM 2016(1)
Applied Surface Science(1)
IEEE Transactions on Industrial Electronics(1)
Lecture Notes in Electrical Engineering(1)
A New Effective Methodology for Semiconductor Power Devices HTRB Testing
ArticleAbstract: An advanced high-temperature reverse bias (HTRB) testing procedure for performing reliability testsPalabras claves:High-temperature reverse bias (HTRB), instrumentation, Power devices, reliability, thermal runawayAutores:Consentino G., D'Ignoti A., Fragomeni L., Galiano S., Grimaldi A., Jorge Hernandez-Ambato, Pace C.Fuentes:googlescopusA novel instrumentation for an advanced high temperature reverse bias (HTRB) testing on power transistors
ArticleAbstract: In this paper, a novel instrumentation for High Temperature Reverse Bias (HTRB) reliability test onPalabras claves:Autores:Giordano C., Jorge Hernandez-Ambato, Pace C.Fuentes:googlescopusDangerous effects induced on power MOSFETs by terrestrial neutrons: A theoretical study and an empirical approach based on accelerated experimental analysis
Conference ObjectAbstract: This paper investigates the effects that terrestrial neutrons can induce on power MOSFETs when theyPalabras claves:accelerated tests, Am-Be source, power MOSFETs, reliability, SEB, SEE, SEGR, Terrestrial neutronsAutores:Consentino G., Giordano C., Jorge Hernandez-Ambato, Laudani M., Marchese N., Mazzeo M., Pace C., Parlato A., Privitera G., Tomarchio E.Fuentes:googlescopusEmbedded mini-Heater design for power loss remote measurement and thermal runaway control on power devices for Accelerated Life Testing
Conference ObjectAbstract: This paper points out to the use of a COTS SAFeFET in the design of an Embedded mini-Heater (EmH) adPalabras claves:ALTs, Embedded mini-Heater, Power Dissipation Measurement, SAFeFET, Temperature control, thermal runawayAutores:Jorge Hernandez-Ambato, Pace C.Fuentes:googlescopusInnovative instrumentation for HTRB tests on semiconductor power devices
Conference ObjectAbstract: An automated system designed to perform reliability tests on power transistors is reported. An innovPalabras claves:Cycles stress, HTRB, Mini-heater, Power devices, reliability, Thermal controlAutores:Consentino G., D'Ignoti A., De Pasquale D., Galiano S., Giordano C., Jorge Hernandez-Ambato, Mazzeo M., Pace C.Fuentes:googlescopusLiquid-phase exfoliated graphene self-assembled films: Low-frequency noise and thermal-electric characterization
ArticleAbstract: In few years, graphene has become a revolutionary material, leading not only to applications in variPalabras claves:Differential 2D-resistivity, Few layers graphene, Liquid phase exfoliation, Low-frequency noise, Self-assembled films, ZeoliteAutores:Caputi L.S., Gabriela Viviana Tubon Usca, Jorge Hernandez-Ambato, Pace C., Tavolaro A.Fuentes:googlescopus