Dangerous effects induced on power MOSFETs by terrestrial neutrons: A theoretical study and an empirical approach based on accelerated experimental analysis

Abstract:

This paper investigates the effects that terrestrial neutrons can induce on power MOSFETs when they are biased during their normal working conditions especially in inverters for photovoltaic applications. After a brief review of power MOSFETs failure phenomena caused by neutron irradiation (with emphasis on so called 'Single Event Effects' (SEE)), the results of an accelerated test performed with the Am-Be source at the University of Palermo are discussed. © 2013 AEIT.

Año de publicación:

2013

Keywords:

• Terrestrial neutrons
• SEE
• SEGR
• power MOSFETs
• SEB
• accelerated tests
• reliability
• Am-Be source

Fuente:

scopus

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