Characterization of carbon films microstructure by atomic force microscopy and Raman spectroscopy

Article

Abstract: Atomic force microscopy has been used to study the surface irregularities of hydrogenated and unhydr

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Autores:

González-Hernandez J., López-Cruz E., Martin Yañez-Limon, Ruiz F., Vázquez-López C.

Fuentes:

scopus