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Characterization of carbon films microstructure by atomic force microscopy and Raman spectroscopy
ArticleAbstract: Atomic force microscopy has been used to study the surface irregularities of hydrogenated and unhydrPalabras claves:Autores:González-Hernandez J., López-Cruz E., Martin Yañez-Limon, Ruiz F., Vázquez-López C.Fuentes:scopusFree carrier absorption in the Ge:Sb:Te system
ArticleAbstract: Absorption in the infrared region in the Ge:Sb:Te system has been observed in films having stoichiomPalabras claves:A. disordered systems, D. Optical properties, D. phase transitions, E. light absorption and reflectionAutores:Chao B.B., González-Hernandez J., López-Cruz E., Martin Yañez-Limon, Ovshinsky S.R., Strand D.Fuentes:scopus