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Algorithmic error correction of impedance measuring sensors
ArticleAbstract: This paper describes novel design concepts and some advanced techniques proposed for increasing thePalabras claves:C-v, ERROR CORRECTION, G-v characteristic meter, Impedance measuring sensorAutores:Alarcón-Aquino V., Sergyienko O., Starostenko O., Tyrsa V.V., Wilmar HernandezFuentes:googlescopusRemote sensor for spatial measurements by using optical scanning
ArticleAbstract: In this paper, we propose a low-cost contact-free measurement system for both 3-D data acquisition aPalabras claves:Health monitoring, LÁSER, Passive scanning, Robot navigationAutores:Cruz L.F.D., Peña-Cabrera M., Sergyienko O., Starostenko O., Tyrsa V.V., Wilmar HernandezFuentes:googlescopusPrecise optical scanning for multiuse
Conference ObjectAbstract: Many approaches for remote measurement techniques for object surfaces and approaches for 3D object rPalabras claves:Autores:Hernández-Balbuena D., Sergyienko O., Tyrsa V.V., Wilmar HernandezFuentes:googlescopus