Some properties of only-SBUs scenarios in SRAMs applied to the detection of MCUs

Conference Object

Abstract: Statistical properties of experiments in SRAMs with only SBUs are mathematically evaluated. Strategi

Palabras claves:

Multiple cell upsets, single bit upsets, single events, soft errors, SRAMs

Autores:

Agapito J.A., Baylac M., Clemente J.A., Francesca Villa, Franco F.J., Hubert G., Mecha H., Puchner H., Rey S., Velazco R.

Fuentes:

scopus