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Characterization of carbon films microstructure by atomic force microscopy and Raman spectroscopy
ArticleAbstract: Atomic force microscopy has been used to study the surface irregularities of hydrogenated and unhydrPalabras claves:Autores:González-Hernandez J., López-Cruz E., Martin Yañez-Limon, Ruiz F., Vázquez-López C.Fuentes:scopusLow temperature crystallization of sputtered carbon films
ArticleAbstract: The crystallization of amorphous carbon films, under inert atmospheres, occurs at annealing temperatPalabras claves:Autores:Chao B., González-Hernandez J., Martin Yañez-Limon, Ovshinsky S.R., Ruiz F.Fuentes:scopusSilicon nanoclusters in Si-SiO<inf>2</inf> system
ArticleAbstract: Low concentration of Si nanoparticles (n-Si) produced by a ball milling method were introduced intoPalabras claves:Autores:Díaz-Flores L.L., Espinoza-Beltran F.J., González-Hernandez J., Martin Yañez-Limon, Morales-Hernández J., Rodríguez-Melgarejo F., Vorobiev Y.V.Fuentes:scopus