Mostrando 4 resultados de: 4
Filtros aplicados
Publisher
Proceedings of the LACCEI international Multi-conference for Engineering, Education and Technology(2)
IEEE Transactions on Device and Materials Reliability(1)
Microelectronics Reliability(1)
BTI saturation and universal relaxation in SiC power MOSFETs
ArticleAbstract: This work focuses on the positive bias temperature instability of SiC-based MOSFETs under differentPalabras claves:de-trapping, PBTI, recovery, SiC, TRAPPING, Universal relaxation, Zafar's modelAutores:Crupi F., Eliana Acurio, Meneghesso G., Reggiani S., Sánchez LuisFuentes:scopusController design for high-energy-efficient performance of a household refrigerator using inverter technology
Conference ObjectAbstract: This work presents the control design of a domestic refrigeration system by using a variable speed cPalabras claves:BLDC, High efficiency, Inverter technology, Refrigeration, Speed controllerAutores:Cristian Tasiguano, Eliana Acurio, F. Hermosa, Marcelo PozoFuentes:googlescopusDesign and construction of an automatic system of ferroelectric ceramics polarization
Conference ObjectAbstract: This work shows the design and construction of an automatic polarizer for ferroelectric ceramics,guaPalabras claves:Automation, ceramics, Energy converters, Ferroelectricity, PI Controller, PolarizationAutores:Cristian Tasiguano, D. Romo, Eliana Acurio, Luis LascanoFuentes:googlescopusReliability Assessment of AlGaN/GaN Schottky Barrier Diodes under ON-State Stress
ArticleAbstract: This article aims to study the degradation of Schottky Barrier Diodes (SBDs) with a Gated Edge TermiPalabras claves:AlGaN/GaN SBD, extrinsic, GET, INTRINSIC, lifetime, on-state, reliabilityAutores:Crupi F., De Jaeger B., Decoutere S., Eliana Acurio, Tatiana Moposita, Trojman L.Fuentes:scopus