Mostrando 10 resultados de: 11
Filtros aplicados
Publisher
IEEE Transactions on Nuclear Science(3)
Electronics (Switzerland)(1)
IEEE Radiation Effects Data Workshop(1)
LATS 2016 - 17th IEEE Latin-American Test Symposium(1)
LATW 2014 - 15th IEEE Latin-American Test Workshop(1)
Área temáticas
Ciencias de la computación(7)
Ciencias sociales(1)
Doctrinas(1)
Electricidad y electrónica(1)
Ingeniería y operaciones afines(1)
A deep analysis of SEU consequences in the internal memory of LEON3 processor
Conference ObjectAbstract: This paper presents an analysis of the effects of Single Event Upset (SEU) into the internal memoryPalabras claves:Autores:Bouesse F., Hadj W.E., Kchaou A., Pablo F. Ramos, PABLO FRANCISCO RAMOS VARGAS, Tourki R., Velazco R.Fuentes:googlescopusAccelerator-based neutron irradiation of integrated circuits at GENEPI2 (France)
Conference ObjectAbstract: GENEPI2 is an accelerator facility located in Grenoble (France) which can provide neutrons of 3 MeVPalabras claves:Integrated circuits, Neutrons, Radiation facility, Radiation ground tests, SEUAutores:Baylac M., Francesca Villa, Hubert G., Mansour W., Pablo F. Ramos, PABLO FRANCISCO RAMOS VARGAS, Rey S., Rossetto O., Velazco R.Fuentes:googlescopusEvaluating the SEE Sensitivity of a 45 nm SOI Multi-Core Processor Due to 14 MeV Neutrons
ArticleAbstract: The aim of this work is to evaluate the SEE sensitivity of a multi-core processor having implementedPalabras claves:Accelerated testing, AMP, Multi-core, SEE, SEFI, SEU, SMP, Soft error, SOIAutores:Baylac M., Clemente J.A., Francesca Villa, Mehaut J.F., Pablo F. Ramos, Rey S., Vanessa Vargas, Velazco R., Zergainoh N.E.Fuentes:scopusEvaluation by neutron radiation of the nmr-mpar fault-tolerance approach applied to applications running on a 28-nm many-core processor
ArticleAbstract: Currently, there is a special interest in validating the use of Commercial-Off-The-Shelf (COTS) multPalabras claves:Many-core processor, partitioning, Radiation ground testing, redundancy, Single event effect, Single event upsetAutores:Pablo F. Ramos, PABLO FRANCISCO RAMOS VARGAS, VANESSA CAROLINA VARGAS VALLEJO, Vanessa Vargas, Velazco R.Fuentes:googlescopusImproving reliability of multi-/many-core processors by using NMR-MPar approach
Book PartAbstract:Palabras claves:Autores:Mehaut J.F., Pablo F. Ramos, Vanessa Vargas, Velazco R.Fuentes:scopusLow-Cost Human–Machine Interface for Computer Control with Facial Landmark Detection and Voice Commands
ArticleAbstract: Nowadays, daily life involves the extensive use of computers, since human beings are immersed in a tPalabras claves:Face tracking, facial landmarks, H/M interface, handicap, Keyboard, mouse, speech recognition, voice commandsAutores:Carlos Ramos-Galarza, Kevin Valencia-Aragón, Mireya Zapata-Rodríguez, Pablo F. Ramos, PABLO FRANCISCO RAMOS VARGAS, VANESSA CAROLINA VARGAS VALLEJO, Vanessa VargasFuentes:googlescopusSensitivity to neutron radiation of a 45 nm SOI multi-core processor
Conference ObjectAbstract: The purpose of this paper is to evaluate the SEU sensitivity of a multi-core SoC working in two diffPalabras claves:Asymmetric multi-processing, Multi-core, SEU, Soft error, SOI, Symmetric Multi-ProcessingAutores:Baylac M., Clemente J.A., Francesca Villa, Pablo F. Ramos, Rey S., Vanessa Vargas, Velazco R., Zergainoh N.E.Fuentes:scopusSingle events in a COTS soft-error free SRAM at low bias voltage induced by 15-MeV neutrons
ArticleAbstract: This paper presents an experimental study of the sensitivity to 15-MeV neutrons of Advanced Low PowePalabras claves:Cots, LPSRAM, neutron tests, radiation hardness, reliability, Soft error, SRAMAutores:Agapito J.A., Baylac M., Clemente J.A., Francesca Villa, Franco F.J., Mecha H., Pablo F. Ramos, PABLO FRANCISCO RAMOS VARGAS, VANESSA CAROLINA VARGAS VALLEJO, Vanessa Vargas, Velazco R.Fuentes:googlescopusRadiation Experiments on a 28 nm Single-Chip Many-Core Processor and SEU Error-Rate Pbkp_rediction
ArticleAbstract: This work evaluates the SEE static and dynamic sensitivity of a single-chip many-core processor haviPalabras claves:Accelerated testing, fault injection, Many-core, parallel processing, SEE, SEFI, SEU, Soft errorAutores:Baylac M., Dupont De Dinechin B., Francesca Villa, Jalier C., Mehaut J.F., Pablo F. Ramos, Ray V., Rey S., Stevens R., Vanessa Vargas, Velazco R., Zergainoh N.E.Fuentes:scopusSEU fault-injection at system level: Method, tools and preliminary results
Conference ObjectAbstract: An approach to study the effects of single event upsets (SEU) by fault injection performed at systemPalabras claves:CPU, Fault-Injection, SEU, Soft error, System-LevelAutores:Ayoubi R., Mansour W., Pablo F. Ramos, Velazco R.Fuentes:scopus