A deep analysis of SEU consequences in the internal memory of LEON3 processor

Abstract:

This paper presents an analysis of the effects of Single Event Upset (SEU) into the internal memory of Aeroflex Gaisler LEON3 processor which is a 32-bit synthesizable processor based on SPARC V8 architecture implemented in an FPGA. A new software methodology allowing fault injection is explored and illustrated in order to classify the faulty behaviors while executing an AES benchmark. An exhaustive fault-injection campaign was performed to test the behavior of LEON3 processor.

Año de publicación:

2016

Keywords:

Fuente:

scopus

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