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IEEE Transactions on Nuclear Science(2)
LATS 2016 - 17th IEEE Latin-American Test Symposium(1)
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Física aplicada(3)
Ciencias de la computación(2)
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Electricidad y electrónica(1)
Programación informática, programas, datos, seguridad(1)
A deep analysis of SEU consequences in the internal memory of LEON3 processor
Conference ObjectAbstract: This paper presents an analysis of the effects of Single Event Upset (SEU) into the internal memoryPalabras claves:Autores:Bouesse F., Hadj W.E., Kchaou A., Pablo F. Ramos, PABLO FRANCISCO RAMOS VARGAS, Tourki R., Velazco R.Fuentes:googlescopusEvaluating the SEE Sensitivity of a 45 nm SOI Multi-Core Processor Due to 14 MeV Neutrons
ArticleAbstract: The aim of this work is to evaluate the SEE sensitivity of a multi-core processor having implementedPalabras claves:Accelerated testing, AMP, Multi-core, SEE, SEFI, SEU, SMP, Soft error, SOIAutores:Baylac M., Clemente J.A., Francesca Villa, Mehaut J.F., Pablo F. Ramos, Rey S., Vanessa Vargas, Velazco R., Zergainoh N.E.Fuentes:scopusSingle events in a COTS soft-error free SRAM at low bias voltage induced by 15-MeV neutrons
ArticleAbstract: This paper presents an experimental study of the sensitivity to 15-MeV neutrons of Advanced Low PowePalabras claves:Cots, LPSRAM, neutron tests, radiation hardness, reliability, Soft error, SRAMAutores:Agapito J.A., Baylac M., Clemente J.A., Francesca Villa, Franco F.J., Mecha H., Pablo F. Ramos, PABLO FRANCISCO RAMOS VARGAS, VANESSA CAROLINA VARGAS VALLEJO, Vanessa Vargas, Velazco R.Fuentes:googlescopus