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IEEE(1)
LATS 2016 - 17th IEEE Latin-American Test Symposium(1)
Springer International Publishing(1)
A deep analysis of SEU consequences in the internal memory of LEON3 processor
Conference ObjectAbstract: This paper presents an analysis of the effects of Single Event Upset (SEU) into the internal memoryPalabras claves:Autores:Bouesse F., Hadj W.E., Kchaou A., Pablo F. Ramos, PABLO FRANCISCO RAMOS VARGAS, Tourki R., Velazco R.Fuentes:googlescopusImproving Reliability of Multi-/Many-Core Processors by Using NMR-MPar Approach
OtherAbstract: The new trend in computing systems is providing solutions by using multicore and many-core processorPalabras claves:Autores:PABLO FRANCISCO RAMOS VARGAS, VANESSA CAROLINA VARGAS VALLEJOFuentes:googleSEU fault-injection at system level: method, tools and preliminary results
OtherAbstract: An approach to study the effects of single event upsets (SEU) by fault injection performed at systemPalabras claves:Autores:PABLO FRANCISCO RAMOS VARGASFuentes:google