System of Diagnostic for SiC Devices in Power Converts by Analisys of Curves of Lissajous

Conference Object

Abstract: this paper present the analysis and implementation of a systems of diagnostic by images based upon t

Palabras claves:

Equipment Failure, Failure analysis, Power Semiconductor, Silicon carbide

Autores:

Efrén Fernández Palomeque, S. Coello Mateo

Fuentes:

scopus