Origins and implications of increased channel hot carrier variability in nFinFETs

Conference Object

Abstract: Channel hot carrier (CHC) stress is observed to result in higher variability of degradation in deepl

Palabras claves:

Bias Temperature Instability (BTI), Channel Hot Carriers (CHC), FinFETs, Time-Dependent Variability

Autores:

Bina M., Bury E., Chiarella T., Cho M., Crupi F., De Keersgieter A., Franco J., Grasser T., Groeseneken G., Horiguchi N., Ji Z., Kaczer B., Luis Miguel Prócel Moya, Pitner G., Putcha V., Roussel P.J., Thean A., Trojman L., Tyaginov S., Weckx P., Wimmer Y.

Fuentes:

google

scopus