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Article(3)
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Applied Physics A: Materials Science and Processing(1)
IET Science, Measurement and Technology(1)
Measurement: Journal of the International Measurement Confederation(1)
An alternative scheme to measure single-point hysteresis loops using piezoresponse force microscopy
ArticleAbstract: We present a simple and low cost procedure to obtain the electromechanical response, in a single-poiPalabras claves:atomic force microscopy, Electromechanical response, Ferroelectrics, Hysteresis loops, PFMAutores:Cruz M.P., Flores-Ruiz F.J., Gervacio-Arciniega J.J., Martin Yañez-Limon, Murillo-Bracamontes E.A., Siqueiros J.M.Fuentes:scopusContact resonance frequencies and their harmonics in scanning probe microscopy
ArticleAbstract: Local characterizations of electric, magnetic, mechanical, electrochemical, and structural propertiePalabras claves:Autores:Cruz M.P., Cruz-Valeriano E., Enríquez-Flores C.I., Gervacio-Arciniega J.J., Martin Yañez-Limon, Murillo-Bracamontes E.A., Palomino-Ovando M.A., Siqueiros J.M.Fuentes:scopusPFM characterization of (K<inf>0.5</inf>Na<inf>0.5</inf>) <inf>0.95</inf>La<inf>0.05</inf>(Nb<inf>0.9</inf>Ti<inf>0.05</inf>)O <inf>2.9</inf> ceramics lead free
ArticleAbstract: The results of ferroelectric properties studies of KNN doped with La and Ti and sintered at temperatPalabras claves:Autores:Durruthy-Rodríguez M.D., Espinoza-Beltran F.J., Fuentes J., Gervacio-Arciniega J.J., Martin Yañez-Limon, Pérez A., Portellez-Rodríguez J., Raymond-Herrera O., Siqueiros J.M.Fuentes:scopus