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An alternative scheme to measure single-point hysteresis loops using piezoresponse force microscopy

Abstract:

We present a simple and low cost procedure to obtain the electromechanical response, in a single-point, of non-conductive materials. The technique makes use of amplitude modulated voltage pulses in an atomic force microscope with standard configuration. Material response obtained, as signals of amplitude and phase from a lock-in amplifier as well as the input signal introduced to the conductive tip are stored in the AFM images, which act like a data acquisition system. The acquired data are processed with a free program that eliminates the necessity of voltage pulses with constant time-widths, enabling the system to study the domain stability in piezo- and ferro-electric materials. We provide the electronic circuit diagram, flowcharts, and a free software for the implementation and execution of this procedure. Our goal is to provide an alternative scheme to measure the strain-hysteretic behavior of nonconductive materials without the need to invest in expensive software or AFM-moduli.