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Journal of Systems and Software(1)
Journal of software: Evolution and Process(1)
Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)(1)
Ontologies for Software Engineering and Software Technology(1)
Software Process Improvement and Practice(1)
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Programación informática, programas, datos, seguridad(4)
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Instrumentos de precisión y otros dispositivos(2)
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scopus(6)
Analysis of the ISO 9126 on software product quality evaluation from the metrology and ISO 15939 perspectives
ArticleAbstract: While metrology has a long tradition of use in physics and chemistry, it is rarely referred to in thPalabras claves:ISO 15939, ISO 9126, metrology, Quality in use metrics, Software measurement, Software metrics, Software product qualtiyAutores:Al-Qutaish R.E., Alain Abran, Cuadrado-Gallego J.J.Fuentes:scopusEngineering the ontology for the SWEBOK: Issues and techniques
Book PartAbstract: Auyang [2] described engineering as "the science of production". This and many other definitions ofPalabras claves:Autores:Alain Abran, Cuadrado-Gallego J.J., García-Barriocanal E., Mendes O., Sánchez-Alonso S., Sicilia M.Á.Fuentes:scopusGuest editorial: Advances in measurements for software processes assessment
OtherAbstract:Palabras claves:Autores:Alain Abran, Cuadrado-Gallego J.J.Fuentes:scopusMeasurement and quantification are not the same: ISO 15939 and ISO 9126
Conference ObjectAbstract: Measurement based on the international standards for measurement (i.e., metrology) is not the same aPalabras claves:Design of a measure, ISO 15939, ISO 9126, metrology, Quality measure, Quantitative models, Software measurementAutores:Alain Abran, Cuadrado-Gallego J.J., Desharnais J.M.Fuentes:scopusLecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics): Preface
OtherAbstract:Palabras claves:Autores:Alain Abran, Bellatreche L., Boavida F., Braungarten R., Brunekreef J., Cuadrado-Gallego J.J., Dieste Ó., Dumke R.R., Filipe Jorge Mota Pinto, Jedlitschka A., Jorge Sá Silva, Krishnamachari B., Lacroix Z., María-Esther Vidal, Natalia JuristoFuentes:scopusSpecial Issue on Software Process and Product Measurement
OtherAbstract:Palabras claves:Autores:Alain Abran, Cuadrado-Gallego J.J.Fuentes:scopus