Mostrando 2 resultados de: 2
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Publisher
IEEE Transactions on Nuclear Science(1)
Proceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS(1)
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Física aplicada(2)
Área de conocimiento
Ingeniería electrónica(1)
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scopus(2)
Grenoble large scale facilities for advanced characterisation of microelectronics devices
Conference ObjectAbstract: The French IRT-Nanoelec consortium in collaboration with GENEPI2 accelerator is offering world uniquPalabras claves:Devices characterisation, Failure analysis, Neutron irradiation, reliability, Thermal neutrons, TomographyAutores:Baylac M., Beaucour J., Capria E., Curfs C., Francesca Villa, Giroud B., Mitchell E., Rey S., Royer J.C., Segura-Ruiz J.Fuentes:scopusEvidence of the robustness of a cots soft-error free SRAM to Neutron Radiation
ArticleAbstract: Radiation tests with 15-MeV neutrons were performed in a COTS SRAM including a new memory cell desigPalabras claves:Cots, LPSRAM, MUSCA SEP3, neutron tests, radiation hardness, reliability, Soft error, SRAMAutores:Baylac M., Clemente J.A., Francesca Villa, Franco F.J., Hubert G., Mansour W., Palomar C., Rey S., Rosetto O., Velazco R.Fuentes:scopus