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IEEE Transactions on Nuclear Science(3)
Proceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS(1)
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scopus(4)
Evaluating the SEE Sensitivity of a 45 nm SOI Multi-Core Processor Due to 14 MeV Neutrons
ArticleAbstract: The aim of this work is to evaluate the SEE sensitivity of a multi-core processor having implementedPalabras claves:Accelerated testing, AMP, Multi-core, SEE, SEFI, SEU, SMP, Soft error, SOIAutores:Baylac M., Clemente J.A., Francesca Villa, Mehaut J.F., Pablo F. Ramos, Rey S., Vanessa Vargas, Velazco R., Zergainoh N.E.Fuentes:scopusSEE Error-Rate Evaluation of an Application Implemented in COTS Multicore/Many-Core Processors
ArticleAbstract: This paper evaluates the error rate of a memory-bound application implemented in different commerciaPalabras claves:Accelerated testing, Error rate, fault injection, many core, Multicore, reliability, single-event effect (SEE), single-event upset (SEU), Soft errorAutores:Baylac M., Pablo F. Ramos, Vanessa Vargas, Velazco R., Zergainoh N.E.Fuentes:scopusSome properties of only-SBUs scenarios in SRAMs applied to the detection of MCUs
Conference ObjectAbstract: Statistical properties of experiments in SRAMs with only SBUs are mathematically evaluated. StrategiPalabras claves:Multiple cell upsets, single bit upsets, single events, soft errors, SRAMsAutores:Agapito J.A., Baylac M., Clemente J.A., Francesca Villa, Franco F.J., Hubert G., Mecha H., Puchner H., Rey S., Velazco R.Fuentes:scopusStatistical Anomalies of Bitflips in SRAMs to Discriminate SBUs from MCUs
ArticleAbstract: Recently, the occurrence of multiple events in static tests has been investigated by checking the stPalabras claves:Multiple cell upsets, neutron tests, Single Event Upsets, SRAMsAutores:Agapito J.A., Baylac M., Clemente J.A., Francesca Villa, Franco F.J., Hubert G., Mecha H., Puchner H., Rey S., Velazco R.Fuentes:scopus