A deep analysis of SEU consequences in the internal memory of LEON3 processor

Conference Object

Abstract: This paper presents an analysis of the effects of Single Event Upset (SEU) into the internal memory

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Autores:

Bouesse F., Hadj W.E., Kchaou A., Pablo F. Ramos, PABLO FRANCISCO RAMOS VARGAS, Tourki R., Velazco R.

Fuentes:

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scopus