Analysis of the influence of the buffer layer in the characteristic impedance of electro-optic modulators

Conference Object

Abstract: In this paper, a theoretical study of the influence of three differents dielectric films in the char

Palabras claves:

characteristic impedance, dielectric buffer layer, HSO, lithium niobate, Silicon nitride, silicon oxide

Autores:

A. G. Correa-Mena, Gabriela Correa-Mena, Gonzalez L.A., Ignacio Enrique Zaldívar-Huerta, Quintero-Rodriguez L.J., Valdes-Rayon J.

Fuentes:

google

scopus