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Subtipo de publicación
Conference Object(2)
Publisher
Proceedings - 3rd International Conference on Emerging Trends in Engineering and Technology, ICETET 2010(1)
Proceedings of SPIE - The International Society for Optical Engineering(1)
Origen
scopus(2)
Impact of random process variations on different 65nm SRAM cell topologies
Conference ObjectAbstract: In this paper, the influence of random process variations on different low leakage SRAM topologies hPalabras claves:Low leakage, Monte Carlo simulations, Random process variation, SRAM cellAutores:Corsonello P., Kansal S., Marco LanuzzaFuentes:scopusSelf-repairing SRAM architecture to mitigate the inter-die process variations at 65nm technology
Conference ObjectAbstract: With aggressive scaling, one of the major barriers that CMOS technology faces is the increasing procPalabras claves:Adaptive body biasing, Process variation mitigation technique, Random process variations, SRAM cellAutores:Corsonello P., Kansal S., Marco LanuzzaFuentes:scopus