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2021 IEEE 22nd Latin American Test Symposium, LATS 2021(1)
IEEE Transactions on Nuclear Science(1)
LATW 2014 - 15th IEEE Latin-American Test Workshop(1)
Proceedings of the 2014 IEEE 20th International On-Line Testing Symposium, IOLTS 2014(1)
Proceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS(1)
Nanosatellite On-Board Computer including a Many-Core Processor
Conference ObjectAbstract: Software fault tolerance techniques can be applied to multi or many-core processors benefitting of tPalabras claves:1: OVNIPROM: Ordinateur de Vol for Nanosatellites Implemented in a PROcessor Many-core. SCUSI 2018 (Soutien aux Coopérations Universitaires et Scientifiques Internationales)Autores:Bastos R.P., Pablo F. Ramos, PABLO FRANCISCO RAMOS VARGAS, Pancher F., Saravia D.C.A., VANESSA CAROLINA VARGAS VALLEJO, Vanessa Vargas, Velazco R.Fuentes:googlescopusImproving reliability of multi-/many-core processors by using NMR-MPar approach
Book PartAbstract:Palabras claves:Autores:Mehaut J.F., Pablo F. Ramos, Vanessa Vargas, Velazco R.Fuentes:scopusRadiation Experiments on a 28 nm Single-Chip Many-Core Processor and SEU Error-Rate Pbkp_rediction
ArticleAbstract: This work evaluates the SEE static and dynamic sensitivity of a single-chip many-core processor haviPalabras claves:Accelerated testing, fault injection, Many-core, parallel processing, SEE, SEFI, SEU, Soft errorAutores:Baylac M., Dupont De Dinechin B., Francesca Villa, Jalier C., Mehaut J.F., Pablo F. Ramos, Ray V., Rey S., Stevens R., Vanessa Vargas, Velazco R., Zergainoh N.E.Fuentes:scopusSEU fault-injection at system level: Method, tools and preliminary results
Conference ObjectAbstract: An approach to study the effects of single event upsets (SEU) by fault injection performed at systemPalabras claves:CPU, Fault-Injection, SEU, Soft error, System-LevelAutores:Ayoubi R., Mansour W., Pablo F. Ramos, Velazco R.Fuentes:scopusPreliminary results of SEU fault-injection on multicore processors in AMP mode
Conference ObjectAbstract: The current technological challenge for computing systems is to use multicore processors in order toPalabras claves:Asymmetric multi-processing, Fault-Injection, Multicore, SEU, Soft errorAutores:Mansour W., Mehaut J.F., Pablo F. Ramos, PABLO FRANCISCO RAMOS VARGAS, VANESSA CAROLINA VARGAS VALLEJO, Vanessa Vargas, Velazco R., Zergainoh N.E.Fuentes:googlescopusSome properties of only-SBUs scenarios in SRAMs applied to the detection of MCUs
Conference ObjectAbstract: Statistical properties of experiments in SRAMs with only SBUs are mathematically evaluated. StrategiPalabras claves:Multiple cell upsets, single bit upsets, single events, soft errors, SRAMsAutores:Agapito J.A., Baylac M., Clemente J.A., Francesca Villa, Franco F.J., Hubert G., Mecha H., Puchner H., Rey S., Velazco R.Fuentes:scopus