Czoschke P.
19
Coauthors
6
Documentos
Volumen de publicaciones por año
Cargando gráfico
| Año de publicación | Num. Publicaciones |
|---|---|
| 2003 | 1 |
| 2004 | 2 |
| 2005 | 2 |
| 2007 | 1 |
Publicaciones por áreas de conocimiento
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| Área de conocimiento | Num. Publicaciones |
|---|---|
| Ciencia de materiales | 11 |
| Nanostructura | 4 |
| Física | 1 |
Publicaciones por áreas temáticas
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| Área temática | Num. Publicaciones |
|---|---|
| Ingeniería y operaciones afines | 5 |
| Física | 4 |
| Física moderna | 3 |
| Magnetismo | 2 |
| Electricidad y electrónica | 2 |
| Cristalografía | 1 |
Principales fuentes de datos
| Origen | Num. Publicaciones |
|---|---|
| Scopus | 6 |
| Google Scholar | 6 |
| RRAAE | 0 |
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Coautores destacados por número de publicaciones
| Coautor | Num. Publicaciones |
|---|---|
| Hong H. | 6 |
| Chiang T.C. | 6 |
| Leonardo Basile | 6 |
| Gray A. | 1 |
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Publicaciones del autor
X-ray studies of the growth of smooth Ag films on Ge(111)-c(2×8)
ArticleAbstract: The growth and morphology of Ag films prepared by low temperature deposition onto Ge(111) were studiPalabras claves:Autores:Chiang T.C., Czoschke P., Hong H., Leonardo BasileFuentes:googlescopusQuantum beating patterns observed in the energetics of Pb film nanostructures
ArticleAbstract: The nanoscale structural evolution of Pb films grown at 110 K on a Si(111) substrate was studied. SuPalabras claves:Autores:Chiang T.C., Czoschke P., Hong H., Leonardo BasileFuentes:googlescopusQuantum oscillations in the layer structure of thin metal films
ArticleAbstract: Understanding the underlying physical principles that determine the internal structure of objects atPalabras claves:Autores:Chiang T.C., Czoschke P., Hong H., Leonardo BasileFuentes:googlescopusQuantum size effects in the surface energy of Pb/Si(111) film nanostructures studied by surface x-ray diffraction and model calculations
ArticleAbstract: We have used surface x-ray diffraction from a synchrotron source, along with models based upon a frePalabras claves:Autores:Chiang T.C., Czoschke P., Hong H., Leonardo BasileFuentes:googlescopusSurface x-ray-diffraction study and quantum well analysis of the growth and atomic-layer structure of ultrathin PbSi(111) films
ArticleAbstract: We present surface x-ray-diffraction results from Pb films grown on pretreated Si(111) substrates atPalabras claves:Autores:Chiang T.C., Czoschke P., Hong H., Leonardo BasileFuentes:googlescopus