Mostrando 4 resultados de: 4
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IEEE International Symposium on Industrial Electronics(1)
Measurement: Journal of the International Measurement Confederation(1)
Sensors(1)
Structural Health Monitoring(1)
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Física aplicada(2)
Ciencias de la computación(1)
Ingeniería y operaciones afines(1)
Métodos informáticos especiales(1)
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Optoelectronic method for structural health monitoring
ArticleAbstract: Important engineering constructions require geometrical monitoring to pbkp_redict their structural hPalabras claves:Measurement result rational approximations, Mediants, Optical instruments, Scanning aperture, Solid angle, Surface figure measurementAutores:Burtseva L.P., Cruz L.F.D., Hernández-Balbuena D., Juan Iván Nieto-Hipólito, Rivas-Lopez M., Sergyienko O., Tyrsa V.V., Wilmar HernandezFuentes:scopusIssues of exact laser ray positioning using DC motors for vision-based target detection
Conference ObjectAbstract: A new Technical Vision System for target detection using a Laser Scanner and the Dynamic TriangulatiPalabras claves:Autores:Fuentes W.F., Hernandez-Balbuena D., Juan Iván Nieto-Hipólito, Karthashov V., Lindner L., Murrieta-Rico F.N., Rivas-Lopez M., Rodriguez-Quinonez J.C., Sergyienko O., Tyrsa V.V.Fuentes:scopusRemote sensor for spatial measurements by using optical scanning
ArticleAbstract: In this paper, we propose a low-cost contact-free measurement system for both 3-D data acquisition aPalabras claves:Health monitoring, LÁSER, Passive scanning, Robot navigationAutores:Cruz L.F.D., Peña-Cabrera M., Sergyienko O., Starostenko O., Tyrsa V.V., Wilmar HernandezFuentes:googlescopusPulse width influence in fast frequency measurements using rational approximations
ArticleAbstract: Many applications have been proposed for the frequency measurement principle using rational approximPalabras claves:Frequency Measurement, Measurement, Pulse width, Rational approximationsAutores:Hernandez-Balbuena D., Juan Iván Nieto-Hipólito, Karthashov V., Lindner L., Murrieta-Rico F.N., Petranovskii V., Rivas-Lopez M., Sergyienko O., Tyrsa V.V.Fuentes:scopus