Mostrando 3 resultados de: 3
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Article(3)
Publisher
Applied Physics A: Materials Science and Processing(1)
IET Science, Measurement and Technology(1)
Measurement: Journal of the International Measurement Confederation(1)
Área temáticas
Electricidad y electrónica(2)
Física(2)
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Instrumentos de precisión y otros dispositivos(2)
Ingeniería y operaciones afines(1)
Origen
scopus(3)
An alternative scheme to measure single-point hysteresis loops using piezoresponse force microscopy
ArticleAbstract: We present a simple and low cost procedure to obtain the electromechanical response, in a single-poiPalabras claves:atomic force microscopy, Electromechanical response, Ferroelectrics, Hysteresis loops, PFMAutores:Cruz M.P., Flores-Ruiz F.J., Gervacio-Arciniega J.J., Martin Yañez-Limon, Murillo-Bracamontes E.A., Siqueiros J.M.Fuentes:scopusDielectric constant measurement using atomic force microscopy of dielectric films: a system theory approach
ArticleAbstract: A technique was developed to measure dielectric constant at microscale based on the system theory apPalabras claves:Autores:Arciniega J.J.G., Cruz-Valeriano E., Davila S.M., Enríquez-Flores C.I., Escamilla-Díaz T., Gutiérrez-Peralta A.M., Guzmán-Caballero D.E., Martin Yañez-Limon, Murillo-Bracamontes E.A., Palmerin J.M., Ramírez-Bon R., Torres-Ochoa J.A.Fuentes:scopusContact resonance frequencies and their harmonics in scanning probe microscopy
ArticleAbstract: Local characterizations of electric, magnetic, mechanical, electrochemical, and structural propertiePalabras claves:Autores:Cruz M.P., Cruz-Valeriano E., Enríquez-Flores C.I., Gervacio-Arciniega J.J., Martin Yañez-Limon, Murillo-Bracamontes E.A., Palomino-Ovando M.A., Siqueiros J.M.Fuentes:scopus