Correlative atomic force microscopy and localization-based super-resolution microscopy: Revealing labelling and image reconstruction artefacts

Article

Abstract: Hybrid microscopy: A correlative microscopy tool that combines in situ super-resolution fluorescence

Palabras claves:

artefacts, atomic force microscopy, Correlative microscopy, DNA imaging, single-molecule microscopy

Autores:

Flors C., Monserrate A., Santiago Casado

Fuentes:

scopus