Mostrando 4 resultados de: 4
Filtros aplicados
Determination of the phonon dispersion of zinc blende (3C) silicon carbide by inelastic x-ray scattering
ArticleAbstract: We present an experimental and theoretical investigation of the phonon dispersion relations in zincPalabras claves:Autores:Cardona M., Choyke W.J., Jorge Serrano, Lorenzen M., Pavone P., Requardt H., Schwoerer-Böhning M., Stojetz B., Strempfer J.Fuentes:scopusFour current examples of characterization of silicon carbide
Conference ObjectAbstract: A description is given of the profiling of CVD grown 3C SiC on undulant (001) Si using low temperatuPalabras claves:Autores:Bai S., Cardona M., Choyke W.J., Devaty R.P., Dorner B., Hobgood D., Jorge Serrano, Ke Y., Kimoto T., Nagasawa H., Porter L.M., Shigiltchoff O., Shishkin Y., Stojetz B., Strauch D.Fuentes:scopusPhonons in SiC from INS, IXS, and Ab-initio calculations
Conference ObjectAbstract: Preliminary results for the phonon dispersion curves of hexagonal 4H-SiC from experimental inelasticPalabras claves:3C-SiC, 4H-SiC, Ab initio calculation, Inelastic neutron scattering, Inelastic X-ray scattering, Phonon dispersion, Scattering intensityAutores:Bosak A., Choyke W.J., Dorner B., Ivanov A., Jorge Serrano, Krisch M., Malorny M., Stojetz B., Strauch D.Fuentes:scopusLattice Dynamics of 4H-SiC by Inelastic X-Ray Scattering
Conference ObjectAbstract: We have measured the phonon dispersion relations in 4H-SiC by inelastic x-ray scattering (IXS) usingPalabras claves:4H Silicon Carbide, Inelastic X-ray scattering, Phonon Dispersion RelationsAutores:Cardona M., Choyke W.J., Jorge Serrano, Lorenzen M., Pavone P., Requardt H., Schwoerer-Böhning M., Stojetz B., Strempfer J.Fuentes:scopus