Mostrando 3 resultados de: 3
Filtros aplicados
Publisher
Applied Physics A: Materials Science and Processing(1)
Journal of Tribology(1)
Proceedings of SPIE - The International Society for Optical Engineering(1)
Área temáticas
Instrumentos de precisión y otros dispositivos(2)
Electricidad y electrónica(1)
Ingeniería y operaciones afines(1)
Luz y radiaciones afines(1)
Tecnología de otros productos orgánicos(1)
Origen
scopus(3)
Dielectric constant measurement using atomic force microscopy of dielectric films: a system theory approach
ArticleAbstract: A technique was developed to measure dielectric constant at microscale based on the system theory apPalabras claves:Autores:Arciniega J.J.G., Cruz-Valeriano E., Davila S.M., Enríquez-Flores C.I., Escamilla-Díaz T., Gutiérrez-Peralta A.M., Guzmán-Caballero D.E., Martin Yañez-Limon, Murillo-Bracamontes E.A., Palmerin J.M., Ramírez-Bon R., Torres-Ochoa J.A.Fuentes:scopusOptical methods of control and characterization of materials for infra-red detectors
Conference ObjectAbstract: A brief review is made of some classic and novel experimental techniques allowing the determinationPalabras claves:Light beam scanning, Photoacoustic spectroscopy, Photothermal pulse technique, Plasma reflection spectra, SEMICONDUCTORAutores:Espinoza-Beltran F.J., Gonzales-Hernandez J., Martin Yañez-Limon, Pérez-Robles J.F., Ramírez-Bon R., Vorobiev Y.V., Zakharchenko R.V., Zakharchenko V.N.Fuentes:scopusLaser Reflection as a Simple Prospect Tool for Nondestructive Quality Control of Charged Lapping Plates
ArticleAbstract: In the present work, a simple laser/detector-based system was assembled and mounted in situ at the pPalabras claves:Autores:Avila-Herrera C., Herrera-Gomez A., Martin Yañez-Limon, Mayén-Mondragón R., Ramírez-Bon R.Fuentes:scopus