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Dimensional metrology of nanometric spherical particles using AFM: I, model development
ArticleAbstract: A model to obtain the tip dimension and the true size of a spherical particle from an image producedPalabras claves:atomic force microscopy, Broadening effect, Tapping mode, Tip CalibrationAutores:Briceño-Valero J., Martínez L., Schilling C.H., V. J. GarcíaFuentes:scopusDimensional metrology of nanometric spherical particles using AFM: II, application of model-tapping mode
ArticleAbstract: Colloidal gold particles of 5, 10 and 15 nm diameter were deposited on silicon chips and used to detPalabras claves:atomic force microscopy, Broadening effect, Tapping mode, Tip CalibrationAutores:Briceño-Valero J., Martínez L., Schilling C.H., V. J. GarcíaFuentes:scopus